Alberto Tosi -
Curriculum Vitae
Address
E-mail: alberto.tosi@polimi.it
Status
Date of
birth: August 3rd, 1975
Place of birth: Borgomanero (NO), Italy
Italian citizen
Civil status: married
Italian clean driver licence (since 1993)
Non-smoker
Publications
and Citations reports on February 1, 2017
Scopus:
Author ID: 35499994500
Total number of publications: 213
Total number of citations: 2037
h-index: 25
Personal
database:
Total number of publications: > 220
1. Scholastic and academic
career
Since
December 2014, Alberto Tosi is Associate professor of Electronics (ING-INF/01)
at “Dipartimento di Elettronica, Informazione e Bioingegneria” in “Scuola
di Ingegnera Industriale e dell’Informazione” of Politecnico di Milano.
From
April 2006 to December 2014, Alberto Tosi was Assistant professor
(Ricercatore di ruolo confermato) of Electronics (ING-INF/01) at “Dipartimento
di Elettronica, Informazione e Bioingegneria” in “Scuola di Ingegnera
Industriale e dell’Informazione” of Politecnico di Milano.
From
April 2005 to March 2006 he was research assistant (assegnista di
ricerca) at “Dipartimento di Elettronica e Informazione” of
Politecnico di Milano.
In 2005 he received the Ph.D. degree (cum laude)
in Information Technology Engineering at Politecnico di Milano.
Major topic: “Non-invasive testing of VLSI circuits”. Advisor: prof. Franco
Zappa.
In 2001 he graduated summa cum laude in Electronics
Engineering at Politecnico di Milano. Thesis topic: “Testing of ULSI
circuits by means of luminescence measurements at single-photon level with high
timing resolution”. Advisor: prof. Franco Zappa.
In 1994 he received the degree “Maturità
Scientifica” at Liceo Scientifico Statale “Enrico Fermi” in Arona (NO).
Final mark: 60/60.
From July 2004 to October 2004, he did an internship
at IBM T.J. Watson, Yorktown Heights, NY (USA), working on
the experimental investigation and testing of VLSI CMOS circuits by means of
single-photon detectors and imaging arrays, like SPAD, SSPD, CCD, HgCdTe
cameras.
In February 2004 he was with CNES (Centre National
d’Etudes Spatiales) – French Space Agency in Toulouse (France), where he
compared and analyzed advanced testing tools and methods for non-invasive
testing of integrated circuits.
Since 2007 he is member of IEEE
(Institute of Electrical and Electronics Engineers), both Electron Devices
Society and Photonics Society (formerly Lasers & Electro-Optics Society).
2. Teaching activities
Since
the 2008/2009 Academic Year, he is in charge of “Electronics” (10
credits) in Biomedical Engineering at Politecnico di Milano.
During
the 2006/2007 and 2007/2008 Academic Years, he taught “Fundamentals of
Electronics” (10 credits) for Telecommunications Engineering at Politecnico
di Milano.
During
the Academic Years from 2002/2003 to 2008/2009, he was teacher assistant
for the courses “Fundamentals of Electronics” (10 credits) for Physics
Engineering, Mathematical Engineering, Engineering for Computer Systems,
Telecommunications Engineering at Politecnico di Milano.
During
the Academic Years from 2002/2003 to 2007/2008, he was teacher and
assistant during the laboratory activities for the courses “Fundamentals
of Electronics” at Politecnico di Milano.
In
the 2002/2003 Academic Year, he was teacher assistant for the course “Electron
Devices” at Politecnico di Milano, Faculty of Information Engineering.
During
the Academic Year from 2002/2003 to 2007/2008, he gave seminars in the course “Sensors,
signals and noise”, held prof. Sergio Cova, at Politecnico di Milano.
In
2013, he was lecturer in the Master course “The expert in
Mechatronics” at “Centro di formazione permanente G. Veronesi”, Rovereto,
Italy, for 32 hours.
In 2007, he prepared the “Multimedia Teaching
Material” for an on-line support course on electronic circuit design at
Politecnico di Milano, Dipartimento di Elettronica e Informazione.
Since
2002 he has been advisor and co-advisor of more than 90 graduating
students in Electronics Engineering at Politecnico di Milano.
Since
2010 he has been advisor for 9 Ph.D. students in Information
Technology Engineering at Politecnico di Milano.
3. Activities for the scientific community
Conferences:
Since 2011 Alberto Tosi is member of Technical
Program Committee (TPC) for the conference Ph. D. Research in Microelectronics
and Electronics (PRIME).
In 2014 and 2015 Alberto Tosi was member of the Organizing
Committee of the conference “Quantum sensing and
Nanophotonic Devices” at SPIE Photonics West.
In 2013 Alberto Tosi was member of the Technical
Committee of CLEO, the Conference on Lasers and Electro-Optics.
In 2010 Alberto Tosi was Session Chair for
"Single-Photon Avalanche Diodes IV" within "Advanced Photon
Counting Techniques IV (Conference 7681)" during "SPIE Defense,
Security, and Sensing 2010", Orlando, USA.
Journals:
Alberto Tosi acted as
reviewer for many (more than 30) papers submitted to scientific journals
published by IEEE, OSA, AIP, Taylor & Francis, Nature Publishing Group, etc.
4. Invited talks
Alberto Tosi gave
invited talks in conferences and workshops:
· SPIE Optics East 2007
· IEEE Photonics Society Meeting 2010
· SPIE Defense, Security and Sensing 2010
· SPIE Photonics West 2011
· SPIE Security+Defense 2012
· Single Photon Workshop 2013
· SPIE Photonics West 2014
· SPIE Defense, Security and Sensing 2014
· CLEO 2016
5. Participation to research projects
Alberto Tosi
contributed to the following research projects funded by public entities:
Project |
Duration |
Role |
“Smart optical and
ultrasound diagnostics of breast cancer (SOLUS)”, H2020 ICT-29-2016-RIA, g.a.
731877 |
48 months |
Principal Investigator for PoliMi-DEIB |
“Laser and Ultrasound
Co-Analyzer for thyroid nodules”, ICT-28-2015, Cross-cutting ICT KETs, g.a.
688303 |
48 months |
Principal Investigator for PoliMi |
“Optical metrology
for quantum-enhanced secure telecommunication”, EURANET EMPIR 14IND05 MIQC2 |
36 months |
Principal Investigator for PoliMi |
“DARPA REVEAL: Scene
Recovery using an extended Plenoptic Function”, University of Wisconsin
subcontract PRJ 144 AAA8584 |
24+24 months |
Principal Investigator for PoliMi |
“Advanced Laser
Ranging Technologies for Altimetry”, ESA ITT AO 1-7483/13/NL/CP. The project
will start in June 2014. |
20 months |
Principal Investigator for PoliMi |
"Development of
high-performance single-photon detectors", European Metrology Research
Programme (EMRP) Grant IND06-REG2 – Researcher Excellence Grant in reference
to JRP: IND06 MIQC |
12 months |
Principal Investigator for PoliMi |
"Microelectronic
Single-Photon 3D Imaging Arrays for low-light high-speed Safety and Security
Applications (MiSPIA)", FP7-ICT-2009.3.7 g.a. 257646 |
36 months |
Co-Principal Investigator for PoliMi |
"Quantum
Interfaces, Sensors, and Communication based on Entanglement (Q‑ESSENCE)",
FP7-ICT-2009.8.2 g.a. 248095 |
36 months |
Participant |
"Multichannel
microelectronics for arrays of Single-Photon detectors and time-resolved
processing for the Optical Spectroscopy of biological tissues", MIUR -
PRIN 2009 - prot. 2009XT785A |
24 months |
Participant |
"SpadA:
ultrasensitive single photon detector arrays for fast transient bidimensional
imaging at 100,000 frames/s and 100ps time-resolution", MIUR - PRIN
2005, prot. 2005095287 |
24 months |
Participant |
"Electro-Luminescence
Microscope: optoelectronic setup for non-invasive testing of ULSI circuits at
30GHz", MIUR - PRIN 2003, prot. 2003091130 |
24 months |
Participant |
"Development of
a Global Network for Secure Communication based on Quantum Cryptography (SECOQ)",
FP6-2002-IST-1-506813 |
36 months |
Participant |
"Enabling
Technologies for Quantum Information Systems - EQUIS",
FP5-IST-1999-11594 |
42 months |
Participant |
"Development of
Monolithic Photon-counter Arrays for Transient High-Energy Phenomena and
Adaptive Optics in Astrophysics", MIUR-PRIN 2002, Prot. 2002021224 |
24 months |
Participant |
6. Research activities
In the SPADlab group, Alberto Tosi is currently
working on the design and development of Single-Photon Avalanche Diodes
(SPADs), in CMOS/BCD technologies and III-V compound semiconductor, for both
visible and near-infrared (up to 1700 nm) spectral ranges.
Single-photon detectors for the near-infrared
wavelength range (1000 – 1700 nm):
Detectors optimized for near-infrared (specifically
for 1550 nm and 1064 nm) are manufactured in InGaAs/InP and
Germanium-on-Silicon, and are operated in gated mode for a short gate-ON
interval (from hundreds of ps to hundreds of nanoseconds) in order to keep
noise low.
After having characterized InGaAs/InP and Germanium
SPADs from different manufacturers, he designed and developed circuits and
methods in order to optimize the performance of InGaAs/InP SPADs for the
different applications. The designed electronic solutions guarantee high
flexibility (wide choice of gate width, bias voltage, avalanche discrimination
threshold, etc.), high gate repetition rates (up to 133 MHz), low timing
jitter, etc. These solutions paved the way to new applications where he
actively contributed, such as Quantum Information Processing and Communication,
Quantum Key Distribution (QKD), Eye safe ranging LIDAR, Optical testing of VLSI
circuits, Time-resolved diffused optical spectroscopy, Photodynamic therapy
(PDT) for cancer treatment, single-photon source characterization, material
science with lifetime measurements at long wavelengths, etc.
For applications requiring extremely high count rates,
he developed compact circuits for GHz sinusoidal gating where the SPAD is
enabled within ultra-short time intervals (few hundreds of ps) in order to
lower the charge flowing through the device, thus strongly reducing the
afterpulsing effect. The developed system proved to reach a count rate higher
than 500 Mcps, extremely low afterpulsing (< 1%), peak detection efficiency
of 30%, low dark count rate and low timing jitter.
He is currently working also on the design and
development of new InGaAs/InP SPADs (both single pixels and arrays). The recent
photodiodes have state-of-the-art performance, with high photon detection
efficiency (30% at 1550 nm), low dark count rate (few kcps), low afterpulsing,
low timing jitter (< 60 ps), excellent active area uniformity.
Recently he also pioneered a new device design for the
development of Ge-on-Si detectors to be integrated in silicon photonics chips
for building integrated systems for quantum computing.
Eventually, the developed detection instruments, based
on InGaAs/InP SPADs, have been exploited in many experimental activities in
collaboration with international research groups for different application
fields.
Single-photon detectors for the visible and
near-infrared wavelength range (300 – 1000 nm):
For applications where single-photon detectors working
up to 1000 nm are required, his research activity focuses on the development of
both detectors (single point and arrays) and techniques, tailored to different
applications.
He developed methods and circuits for ultra-fast
time-gated SPAD detectors (rise-time of few hundreds of ps) with low timing jitter
(few tens of ps) for high-resolution waveform reconstruction. He conceived and
developed the ultra-fast gating (rise-time < 200 ps) electronics for
time-resolved diffuse optical spectroscopy, which guarantees waveform
reconstruction with high linearity and wide dynamic range (7 decades). Such
instrumentation was successfully exploited in brain functional imaging, optical
mammography, food quality assessments, and other biomedical applications,
fundamental physics experiments, etc., where he actively contributed.
He is currently working on new CMOS and BCD SPAD
devices and microelectronic circuits, such as linear and two-dimensional SPAD
arrays for high frame-rate acquisitions. He designed and developed imagers with
up to 2048 SPAD pixels, based on “smart pixels” where processing electronics
for counting and timing is integrated in each pixel. Specifically, he
supervised the design and development of high-resolution (down to 10 ps) high
linearity (DNL < 2% LSB) time-to-digital converters (TDCs). Moreover, he
conceived and integrated novel SPAD arrays with time-tagging capability.
Fully-working SPAD cameras have been developed and exploited in various
collaborations with international research groups for LIDAR in the automotive
safety field, FLIM (Fluorescence Lifetime Imaging), FCS (Fluorescence
Correlation Spectroscopy), Diffuse Optical Spectroscopy and Tomography,
spectral source characterization, etc.
Non-invasive testing of VLSI circuits:
He developed methods and techniques for investigating
signals propagating inside VLSI CMOS circuits. He exploited various detectors
(SPAD, SSPD, HgCdTe camera, etc.) for the efficient acquisition of the
electroluminescence from MOSFET’s switching in VLSI circuits. He developed the
optical systems, the electronic instrumentation and the methods for testing the
circuits and finding the faulty devices.
Pubblications (see attached list):
He is co-author of more than 220 papers on
peer-reviewed journals and conference proceedings, and he is the co-inventor of
3 patents for improving the optical testing of integrated circuits.
Pubblications of Alberto Tosi
February 1, 2017
[1] M.
Buttafava, E. Martinenghi, D. Tamborini, D. Contini, A. D. Mora, M. Renna, A.
Torricelli, A. Pifferi, F. Zappa, and A. Tosi, “A Compact Two-Wavelength
Time-Domain NIRS System Based on SiPM and Pulsed Diode Lasers,” IEEE
Photonics J., vol. 9, no. 1, pp. 7800114-1-7800114–14, Feb. 2017.
[2] D.
Bronzi, F. Villa, S. Tisa, A. Tosi, and F. Zappa, “SPAD Figures of Merit for
Photon-Counting, Photon-Timing, and Imaging Applications: A Review,” IEEE
Sens. J., vol. 16, no. 1, pp. 1–1, 2016.
[3] N.
Calandri, M. Sanzaro, A. Tosi, C. Savoia, and L. Motta, “Optical crosstalk in
InGaAs/InP SPAD array: analysis and reduction with FIB-etched trenches,” IEEE
Photonics Technol. Lett., vol. 28, no. 16, pp. 1767–1770, Aug. 2016.
[4] N.
Calandri, M. Sanzaro, A. Tosi, and F. Zappa, “Charge Persistence in InGaAs/InP
Single-Photon Avalanche Diodes,” IEEE J. Quantum Electron., vol. 52, no.
3, pp. 1–7, Mar. 2016.
[5] M.
Castello, G. Tortarolo, I. C. Hernández, P. Bianchini, M. Buttafava, G. Boso,
A. Tosi, A. Diaspro, and G. Vicidomini, “Gated-sted microscopy with
subnanosecond pulsed fiber laser for reducing photobleaching,” Microsc. Res.
Tech., Jul. 2016.
[6] L.
Di Sieno, H. Wabnitz, A. Pifferi, M. Mazurenka, Y. Hoshi, A. Dalla Mora, D.
Contini, G. Boso, W. Becker, F. Martelli, A. Tosi, and R. Macdonald,
“Characterization of a time-resolved non-contact scanning diffuse optical
imaging system exploiting fast-gated single-photon avalanche diode detection,” Rev.
Sci. Instrum., vol. 87, no. 3, p. 35118, Mar. 2016.
[7] X.
Meng, S. Xie, X. Zhou, N. Calandri, M. Sanzaro, A. Tosi, C. H. Tan, and J. S.
Ng, “InGaAs/InAlAs single photon avalanche diode for 1550 nm photons,” R.
Soc. Open Sci., vol. 3, no. 3, p. 150584, Mar. 2016.
[8] F.
Piacentini, A. Avella, M. P. Levi, M. Gramegna, G. Brida, I. P. Degiovanni, E.
Cohen, R. Lussana, F. Villa, A. Tosi, F. Zappa, and M. Genovese, “Measuring
Incompatible Observables by Exploiting Sequential Weak Values,” Phys. Rev.
Lett., vol. 117, no. 17, p. 170402, Oct. 2016.
[9] F.
Piacentini, A. Avella, M. P. Levi, R. Lussana, F. Villa, A. Tosi, F. Zappa, M.
Gramegna, G. Brida, I. P. Degiovanni, and M. Genovese, “Experiment
Investigating the Connection between Weak Values and Contextuality,” Phys.
Rev. Lett., vol. 116, no. 18, p. 180401, May 2016.
[10] F.
Piacentini, A. Avella, M. P. Levi, R. Lussana, F. Villa, A. Tosi, F. Zappa, M.
Gramegna, G. Brida, I. P. Degiovanni, and M. Genovese, “Experiment
Investigating the Connection between Weak Values and Contextuality,” Phys.
Rev. Lett., vol. 116, no. 18, p. 180401, May 2016.
[11] C.
J. Pugh, P. Kolenderski, C. Scarcella, A. Tosi, and T. Jennewein, “Towards
correcting atmospheric beam wander via pump beam control in a down conversion
process,” Opt. Express, vol. 24, no. 18, p. 20947, Sep. 2016.
[12] M.
Sanzaro, N. Calandri, A. Ruggeri, and A. Tosi, “InGaAs/InP SPAD With
Monolithically Integrated Zinc-Diffused Resistor,” IEEE J. Quantum Electron.,
vol. 52, no. 7, pp. 4500207-1-4500207–7, Jul. 2016.
[13] J.
Sutin, B. Zimmerman, D. Tyulmankov, D. Tamborini, C. W. Kuan, J. Selb, A.
Gulinatti, I. Rech, A. Tosi, D. A. Boas, and M. A. Franceschini, “Time-domain
diffuse correlation spectroscopy,” Optica, vol. 3, no. 9, pp. 1006–1013,
Sep. 2016.
[14] R.
S. Aspden, N. R. Gemmell, P. A. Morris, D. S. Tasca, L. Mertens, M. G. Tanner,
R. A. Kirkwood, A. Ruggeri, A. Tosi, R. W. Boyd, G. S. Buller, R. H. Hadfield,
and M. J. Padgett, “Photon-sparse microscopy: visible light imaging using
infrared illumination,” Optica, vol. 2, no. 12, p. 1049, Dec. 2015.
[15] R.
Aspden, N. R. Gemmell, P. Morris, D. S. Tasca, L. Mertens, M. G. Tanner, R. A.
Kirkwood, A. Ruggeri, A. Tosi, R. W. Boyd, G. S. Buller, R. H. Hadfield, and M.
J. Padgett, “Trans-spectral Ghost Microscopy,” in Frontiers in Optics 2015,
2015, p. FTh4D.8.
[16] W.
Becker, Advanced Time-Correlated Single Photon Counting Applications,
vol. 111. Cham: Springer International Publishing, 2015.
[17] G.
Boso, M. Buttafava, F. Villa, and A. Tosi, “Low-Cost and Compact Single-Photon
Counter Based on a CMOS SPAD Smart Pixel,” IEEE Photonics Technol. Lett.,
vol. 27, no. 23, pp. 2504–2507, Dec. 2015.
[18] D.
Bronzi, F. Villa, S. Tisa, A. Tosi, and F. Zappa, “SPAD Detectors and Imagers:
Figures of merit for Photon-counting and Photon-timing Applications,” IEEE
Sens. J., vol. PP, no. 99, pp. 1–1, 2015.
[19] D.
Bronzi, Y. Zou, S. Bellisai, F. Villa, S. Tisa, A. Tosi, and F. Zappa, “SPADAS:
a high-speed 3D single-photon camera for advanced driver assistance systems,”
in Proc. SPIE 9366, Smart Photonic and Optoelectronic Integrated Circuits
XVII, 2015, p. 93660M.
[20] D.
Bronzi, Y. Zou, F. Villa, S. Tisa, A. Tosi, and F. Zappa, “Automotive
Three-Dimensional Vision Through a Single-Photon Counting SPAD Camera,” IEEE
Trans. Intell. Transp. Syst., vol. PP, no. 99, pp. 1–14, 2015.
[21] M.
Buttafava, J. Zeman, A. Tosi, K. Eliceiri, and A. Velten, “Non-line-of-sight
imaging using a time-gated single photon avalanche diode,” Opt. Express, vol. 23, no. 16, p. 20997,
Aug. 2015.
[22] M. Celebrano,
M. Baselli, M. Bollani, J. Frigerio, A. Bahgat Shehata, A. Della Frera, A.
Tosi, A. Farina, F. Pezzoli, J. Osmond, X. Wu, B. Hecht, R. Sordan, D.
Chrastina, G. Isella, L. Duò, M. Finazzi, and P. Biagioni, “Emission
Engineering in Germanium Nanoresonators,” ACS Photonics, vol. 2, no. 1,
pp. 53–59, Jan. 2015.
[23] D.
Contini, A. D. Mora, L. Spinelli, A. Farina, A. Torricelli, R. Cubeddu, F.
Martelli, G. Zaccanti, A. Tosi, G. Boso, F. Zappa, and A. Pifferi, “Effects of
time-gated detection in diffuse optical imaging at short source-detector
separation,” J. Phys. D. Appl. Phys., vol. 45401, no. 4, p. 45401, Feb.
2015.
[24] A. Dalla Mora,
D. Contini, S. R. Arridge, F. Martelli, A. Tosi, G. Boso, A. Farina, T.
Durduran, E. Martinenghi, A. Torricelli, and A. Pifferi, “Towards next
generation time-domain diffuse optics devices,” in Proc. SPIE 9319, Optical Tomography and Spectroscopy of Tissue XI, 2015, p. 93191J.
[25] A.
Dalla Mora, D. Contini, S. Arridge, F. Martelli, A. Tosi, G. Boso, A. Farina,
T. Durduran, E. Martinenghi, A. Torricelli, and A. Pifferi, “Towards
next-generation time-domain diffuse optics for extreme depth penetration and
sensitivity,” Biomed. Opt. Express, vol. 6, no. 5, pp. 1749–1760, May
2015.
[26] A.
Dalla Mora, E. Martinenghi, D. Contini, A. Tosi, G. Boso, T. Durduran, S.
Arridge, F. Martelli, A. Farina, A. Torricelli, and A. Pifferi, “Fast silicon
photomultiplier improves signal harvesting and reduces complexity in
time-domain diffuse optics,” Opt. Express, vol. 23, no. 11, p. 13937,
May 2015.
[27] A. Dalla Mora,
A. Tosi, D. Contini, L. Di Sieno, G. Boso, F. Villa, and A. Pifferi, “Memory
effect in silicon time-gated single-photon avalanche diodes,” J. Appl. Phys., vol. 117, no. 11, p. 114501, Mar. 2015.
[28] T.
Dragojević, D. Bronzi, H. M. Varma, C. P. Valdes, C. Castellvi, A. Tosi, F.
Zappa, C. Justicia, and T. Durduran, “Multi-Exposure, Continous Laser Speckle
Contrast Imaging of Mouse Brain Enable by A Novel Single Photon Avalanche Diode
(SPAD) Array,” in XXVIIth International Symposium on Cerebral Blood Flow,
Metabolism and Function & XIIth International Conference on Quantification
of Brain Function with PET, 2015.
[29] T.
Dragojević, D. Bronzi, H. M. Varma, C. P. Valdes, C. Castellvi, F. Villa, A.
Tosi, C. Justicia, F. Zappa, and T. Durduran, “High-speed multi-exposure laser
speckle contrast imaging with a single-photon counting camera,” Biomed. Opt.
Express, vol. 6, no. 8, p. 2865, Jul. 2015.
[30] P.
Foglia Manzillo, C. N. van Dijk, S. Conticello, M. Esposito, R. Lussana, F.
Villa, D. Tamborini, F. Zappa, A. Tosi, A. Roncat, N. Pfeiffer, T. Entner, and
D. Lampridis, “ALART: a novel lidar system for vegetation height retrieval from
space,” in Proc. SPIE 9645, Lidar Technologies, Techniques, and Measurements
for Atmospheric Remote Sensing XI, 2015, p. 96450E.
[31] I.
C. Hernández, M. Buttafava, G. Boso, A. Diaspro, A. Tosi, and G. Vicidomini,
“Gated STED microscopy with time-gated single-photon avalanche diode,” Biomed.
Opt. Express, vol. 6, no. 6, pp. 2258–2267, Jun. 2015.
[32] G.
Intermite, A. McCarthy, R. E. Warburton, X. Ren, F. Villa, R. Lussana, A. J.
Waddie, M. R. Taghizadeh, A. Tosi, F. Zappa, and G. S. Buller, “Fill-factor
improvement of Si CMOS single-photon avalanche diode detector arrays by
integration of diffractive microlens arrays,” Opt. Express, vol. 23, no.
26, p. 33777, Dec. 2015.
[33] G.
Intermite, R. E. Warburton, A. McCarthy, X. Ren, F. Villa, A. J. Waddie, M. R.
Taghizadeh, Y. Zou, F. Zappa, A. Tosi, and G. S. Buller, “Enhancing the
fill-factor of CMOS SPAD arrays using microlens integration,” in Proc. SPIE
9504, Photon Counting Applications 2015, 2015, p. 95040J.
[34] R.
Lussana, F. Villa, A. D. Mora, D. Contini, A. Tosi, and F. Zappa, “Enhanced
single-photon time-of-flight 3D ranging,” Opt. Express, vol. 23, no. 19,
pp. 24962–24973, Sep. 2015.
[35] E.
Martinenghi, A. Dalla Mora, D. Contini, A. Torricelli, A. Tosi, G. Boso, S. R.
Arridge, F. Martelli, A. Farina, T. Durduran, and A. Pifferi, “Performance
Breakthrough in Time-Domain Diffuse Optics: Next-Generation Devices,” Abstr.
FOTONICA 2015 - Convegno Ital. delle Tecnol. Fotoniche - 217th Ed., 2015.
[36] A.
Puszka, L. Di Sieno, A. D. Mora, A. Pifferi, D. Contini, A. Planat-Chrétien, A.
Koenig, G. Boso, A. Tosi, L. Hervé, and J.-M. Dinten, “Spatial resolution in
depth for time-resolved diffuse optical tomography using short source-detector
separations,” Biomed. Opt. Express, vol. 6, no. 1, pp. 1–10, 2015.
[37] A.
Ruggeri, P. Ciccarella, F. Villa, F. Zappa, and A. Tosi, “Integrated Circuit
for Subnanosecond Gating of InGaAs/InP SPAD,” IEEE J. Quantum Electron.,
vol. 51, no. 7, pp. 1–7, Jul. 2015.
[38] M.
Sanzaro, N. Calandri, A. Ruggeri, C. Scarcella, G. Boso, M. Buttafava, and A.
Tosi, “InGaAs/InP single-photon detector with low noise, low timing jitter and
high count rate,” in Proc. SPIE 9370, Quantum Sensing and Nanophotonic
Devices XII, 2015, p. 93701T.
[39] C.
Scarcella, G. Boso, A. Ruggeri, and A. Tosi, “InGaAs/InP single-photon detector
gated at 1.3 GHz with 1.5 % afterpulsing,” IEEE J. Sel. Top. Quantum
Electron., vol. 21, no. 3, pp. 1–1, 2015.
[40] D.
Tamborini, D. Portaluppi, S. Tisa, and A. Tosi, “Time-to-digital converter card
for multichannel time-resolved single-photon counting applications,” in Proc.
SPIE 9369, Photonic Instrumentation Engineering II, 2015, p. 93690Q.
[41] A.
Torricelli, D. Contini, A. Dalla Mora, D. Tamborini, F. Villa, A. Tosi, and L.
Spinelli, “Recent Advances in Time-Resolved NIR Spectroscopy for Nondestructive
Assessment of Fruit Quality,” in CHEMICAL ENGINEERING TRANSACTIONS,
2015, vol. 44, pp. 43–48.
[42] F.
Villa, R. Lussana, D. Bronzi, A. Dalla Mora, D. Contini, S. Tisa, A. Tosi, and
F. Zappa, “High linearity SPAD and TDC array for TCSPC and 3D ranging
applications,” in Proc. SPIE 9370, Quantum Sensing and Nanophotonic Devices
XII, 2015, p. 93701U.
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Monolithic Single-Photon Imagers,” in 38th European Solid-State Device
Research Conference and the 34th European Solid-State Circuits Conference,
ESSDERC/ESSCIRC 2008. Conference Proceedings, 2008, pp. 274–277.
[198] A. Tosi, A. Dalla Mora, F. Pozzi, and F. Zappa, “Modeling and
Probing Hot-Carrier Luminescence From MOSFETs,” IEEE Electron Device Lett.,
vol. 29, no. 4, pp. 350–352, Apr. 2008.
[199] A. Tosi, A. Dalla Mora, and F. Zappa, “All-silicon 1.55 µm
high-resolution photon counting and timing,” Photonics Technol. Lett. IEEE,
vol. 20, no. 23, pp. 1956–1958, 2008.
[200] A. Tosi, F. Stellari, F. Zappa, and P. Song, “A Packaging Solution
for Optically Testing Wire-Bonded Chips,” Adv. Packag. IEEE Trans., vol.
31, no. 3, pp. 490–495, 2008.
[201] S. Cova, A. Tosi, F. Zappa, and A. Dalla Mora, “Single-Photon
Avalanche Diodes for quantum key distribution,” Proceedings of Single Photon
Workshop 2007. Istituto
Nazionale di Ricerca Metrologica INRIM, TORINO, pp. 27–28, 2007.
[202] A. Dalla Mora,
A. Tosi, S. Tisa, and F. Zappa, “Single-Photon Avalanche Diode Model for
Circuit Simulations,” IEEE Photonics Technol. Lett., vol. 19, no. 23, pp. 1922–1924, Dec. 2007.
[203] A. Dalla Mora, A. Tosi, and F. Zappa, “Silicon Single Photon
Avalanche Diode with 25 ps resolution at 1.55 µm,” in Proceedings of Single
Photon Workshop 2007, 2007, pp. 106–107.
[204] M. A. Itzler, R. Ben-Michael, C.-F. Hsu, K. Slomkowski, A. Tosi, S.
Cova, F. Zappa, and R. Ispasoiu, “Single photon avalanche diodes (SPADs) for
1.5 μm photon counting applications,” J. Mod. Opt., vol. 54, no. 2–3,
pp. 283–304, Jan. 2007.
[205] A. Pifferi, A. Torricelli, L. Spinelli, D. Contini, R. Cubeddu, F.
Martelli, G. Zaccanti, A. Tosi, A. Dalla Mora, F. Zappa, and S. Cova,
“Time-resolved diffuse reflectance at small source-detector separation using a
time-gated single-photon avalanche diode,” in Proc. SPIE 6631, Novel Optical
Instrumentation for Biomedical Applications III, 2007, vol. 6631, p.
66310B–66310B–5.
[206] S. Tisa, A. Tosi, and F. Zappa, “Fully-integrated CMOS single
photon counter,” Opt. Express, vol. 15, no. 6, p. 2873, 2007.
[207] S. Tisa, F. Zappa, A. Tosi, and S. Cova, “Electronics for single
photon avalanche diode arrays,” Sensors Actuators A Phys., vol. 140, no.
1, pp. 113–122, Oct. 2007.
[208] A. Torricelli, A. Pifferi, L. Spinelli, D. Contini, R. Cubeddu, A.
Tosi, A. Dalla Mora, F. Zappa, and S. Cova, “Time-gated single-photon avalanche
photodiode for time-resolved diffuse reflectance at small source-detector
separation,” in Proc. SPIE 6771, Advanced Photon Counting Techniques II,
2007, vol. 6771, p. 67710J–1–67710J–5.
[209] A. Tosi, A. Dalla Mora, F. Zappa, and S. Cova, “Germanium and
InGaAs/InP SPADs for Single-Photon Detection in the Near-Infrared,” in Proceedings
of SPIE Optics East 2007 - Advanced Photon Counting Techniques II, 2007, p.
67710P–67710P–12.
[210] F. Zappa, S. Tisa, A. Tosi, and S. Cova, “Principles and features
of single-photon avalanche diode arrays,” Sensors Actuators A Phys.,
vol. 140, no. 1, pp. 103–112, Oct. 2007.
[211] F. Zappa, A. Tosi, and S. Cova, “InGaAs SPAD and electronics for
low time jitter and low noise,” in Proc. SPIE 6583, Photon Counting
Applications, Quantum Optics, and Quantum Cryptography, 2007, vol. 6583, p.
65830E–1–65830E–12.
[212] S. Cova, A. Tosi, A. Gulinatti, F. Zappa, and M. Ghioni, “Avalanche
Diodes and Circuits for Infrared Photon Counting and Timing: Retrospect and Prospect,”
IEEE LEOS Newsl., vol. 20, pp. 25–28, 2006.
[213] A. Pifferi, A. Torricelli, L. Spinelli, R. Cubeddu, F. Martelli, G.
Zaccanti, S. Del Bianco, A. Tosi, F. Zappa, and S. Cova, “Time-Resolved Diffuse
Reflectance at Null Source-Detector Separation: A Novel Approach to Photon
Migration,” in Biomedical Optics, Technical Digest (CD), 2006, p. TuD5.
[214] F. Stellari, A. Tosi, and P. Song, “Switching Time Extraction of
CMOS Gates using Time-Resolved Emission (TRE),” in 2006 IEEE International
Reliability Physics Symposium Proceedings, 2006, pp. 566–573.
[215] A. Tosi, S. Cova, F. Zappa, M. A. Itzler, and R. Ben-Michael,
“InGaAs/InP Single Photon Avalanche Diode Design and Characterization,” in 2006
European Solid-State Device Research Conference, 2006, pp. 335–338.
[216] A. Tosi, A. Gallivanoni, F. Zappa, and S. Cova, “Gated Operation of
InGaAs SPADs with Active-Quenching and Fast Timing Circuits,” in Proceedings
of SPIE Optics East 2006 - Advanced Photon Counting Techniques, 2006, vol.
6372, p. 63720Q–63720Q–12.
[217] A. Tosi, F. Stellari, A. Pigozzi, G. Marchesi, and F. Zappa,
“Hot-Carrier Photoemission in Scaled CMOS Technologies: A Challenge for
Emission Based Testing and Diagnostics,” in 2006 IEEE International
Reliability Physics Symposium Proceedings, 2006, pp. 595–601.
[218] M. A. Itzler, R. Ben-Michael, C.-F. Hsu, K. Slomkowski, A. Tosi, S.
Cova, F. Zappa, and R. Ispasoiu, “Single photon avalanche diodes for 1.5 µm
photon counting applications,” in Proceedings of Single Photon Workshop 2005,
2005, pp. 42–43.
[219] F. Stellari, P. Song, J. Hryckowian, O. A. Torreiter, S. Wilson, P.
Wu, and A. Tosi, “Characterization of a 0.13 μm CMOS Link Chip using Time Resolved
Emission (TRE),” Microelectron. Reliab., vol. 45, no. 9–11, pp.
1550–1553, Sep. 2005.
[220] A. Tosi, F. Stellari, and F. Zappa, “Innovative packaging technique
for backside optical testing of wire-bonded chips,” Microelectron. Reliab., vol. 45, no. 9–11, pp.
1493–1498, Sep. 2005.
[221] F. Stellari, A. Tosi, F. Zappa, and S. Cova, “CMOS Circuit Testing
via Time-Resolved Luminescence Measurements and Simulations,” IEEE Trans.
Instrum. Meas., vol. 53, no. 1, pp. 163–169, Feb. 2004.
[222] A. Tosi, M. REMMACH, R. DESPLATS, F. ZAPPA, and P. PERDU,
“Implementation of TRE systems into Emission Microscopes,” Microelectron.
Reliab., vol. 44, no. 9–11, pp. 1529–1534, Sep. 2004.
[223] A. Tosi, F. Stellari, and F. Zappa, “Current crowding in faulty
MOSFET: optical and electrical investigation,” Microelectron. Reliab.,
vol. 44, no. 9–11, pp. 1577–1581, Sep. 2004.
[224] A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Hot-carrier
luminescence: comparison of different CMOS technologies,” in 33rd Conference
on European Solid-State Device Research, 2003. ESSDERC ’03., 2003, pp.
351–354.
[225] A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Backside Flip-Chip
testing by means of high-bandwidth luminescence detection,” Microelectron. Reliab., vol. 43, no. 9–11, pp.
1669–1674, 2003.
[226] A. Tosi, F. Zappa, S. Cova,
and F. Stellari, “Luminescence measurements for the investigation of VLSI
circuit defects,” in Sensors and Microsystems: Proceedings of the 8th
Italian Conference AISEM, 2003, pp. 521–527.
Patents
Franco Stellari, Alberto Tosi, Peilin Song
"System
and Method for estimation of integrated circuit signal characteristics using
optical measurements"
US 7,612,571 B2, date Nov. 3, 2009
Alberto Tosi, Franco Stellari, Franco Zappa, Peilin Song
"Apparatus
and methods for packaging electronic devices for optical testing"
US 7,635,904 B2, date Dec. 22, 2009
Franco Stellari, Alberto Tosi, Franco Zappa, Peilin Song
"Method
and Apparatus for creating time-resolved emission images of integrated circuits
using a single-point Single-Photon Detector and a Scanning System"
US
8,115,170 B2, date Feb. 14, 2012